Guilin Huayi Peakmeter Technology Co.,Ltd
Guilin Huayi Peakmeter Technology Co.,Ltd
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PEAKMETER LCR Meters, Precision Component Impedance Measuring Instruments

Test inductance, capacitance and resistance for electronic component production and laboratory use
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What Is Peakmeter LCR Meter Used For in Component Testing?

What Is Peakmeter LCR Meter Used For in Component Testing?

1. Accurate LCR Parameter Measurement

Peakmeter LCR meter precisely tests inductance, capacitance and resistance values of electronic components. It delivers high-precision data to verify whether component parameters match standard specifications, effectively screening unqualified parts in batch testing.


2. Component Quality & Defect Inspection

It detects common component faults including damaged capacitance, inductance attenuation and resistor deviation. The meter identifies aging, open circuit and short-circuit issues, helping engineers eliminate faulty components and ensure circuit stability.


3. Supports Frequency Switchable Professional Testing

With multiple test frequency options, it adapts to different component testing requirements. It meets both daily conventional detection and professional high-frequency testing standards, suitable for precise inspection of precision electronic parts and industrial components.


How Accurate Is Peakmeter Digital LCR Meter for Capacitance and Inductance?


1. Tiered Accuracy Grading with Wide Full-Range Coverage for Capacitance & Inductance Measurement

Peakmeter handheld LCR instruments adopt segmented accuracy design under standard test environment (23℃ reference temperature, humidity 45%–75%RH), with the optimal test interval reaching ±(0.8% reading + 3 digits), far exceeding ordinary multimeters with simple L/C auxiliary functions. For capacitance testing, it seamlessly covers ultra-small pF-level chip ceramic capacitors to large thousands-of-microfarad electrolytic capacitors; mid-range common capacitance values maintain the highest precision, while ultra-small and ultra-large capacitance bands only introduce tiny fixed digit errors without obvious reading deviation. For inductance measurement, the range spans miniature 0.01μH SMD inductors to high-power transformers up to thousands of henries, and each inductance segment matches exclusive error standards to ensure stable and credible test data for component incoming inspection.


2. Four-Terminal Kelvin Test Structure Plus OPEN/SHORT Auto-Calibration Eliminates Lead & Contact Systematic Errors

Traditional two-wire test tools are severely disturbed by test line resistance, clip contact impedance and stray inductance when measuring low-value inductors and tiny capacitors, resulting in large accuracy loss. All Peakmeter digital LCR meters are equipped with complete four-terminal Kelvin measurement ports that separate excitation current and signal sampling loops to completely shield wire resistance interference. Meanwhile, the one-key open-circuit and short-circuit zero calibration function allows users to eliminate inherent system errors before testing, effectively solving inaccurate readings caused by aging test leads, loose probes or dirty PCB pads, and greatly improving the repeatability of capacitance and inductance measurements in long-term continuous batch testing.


3. Multiple Selectable Test Frequencies with Independent Calibration Curves to Avoid Frequency-Deviated L/C Test Results

Peakmeter LCR meters support switchable 100Hz, 1kHz and 10kHz professional test frequencies, and each frequency point is pre-calibrated with independent accuracy curves during factory production to adapt to the actual working frequency of different capacitors and inductors. High-frequency 10kHz mode is specially optimized for miniature SMD inductors and high-frequency chip capacitors on PCBs to reduce impedance deviation under high-speed circuit working conditions, while low-frequency 100Hz mode ensures accurate test results for large power inductors and large-capacity electrolytic capacitors with obvious loss characteristics. This frequency-matching design fundamentally avoids the large measurement error of single-frequency cheap testers when facing diversified electronic components.


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